Hi,

Please find the latest report on new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan.

1 new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan. 8 defect(s), reported by Coverity Scan earlier, were marked fixed in the recent build analyzed by Coverity Scan.

New defect(s) Reported-by: Coverity Scan Showing 1 of 1 defect(s)

** CID 425810: High impact quality (WRITE_CONST_FIELD) /plat/nxp/s32/s32g274ardb2/plat_console.c: 17 in console_s32g2_register()

________________________________________________________________________________________________________ *** CID 425810: High impact quality (WRITE_CONST_FIELD) /plat/nxp/s32/s32g274ardb2/plat_console.c: 17 in console_s32g2_register() 11 12 void console_s32g2_register(void) 13 { 14 static console_t s32g2_console; 15 int ret; 16

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CID 425810:  High impact quality  (WRITE_CONST_FIELD)
A write to an aggregate overwrites a const-qualified field within the aggregate.

17 (void)memset(&s32g2_console, 0, sizeof(s32g2_console)); 18 19 ret = console_linflex_register(UART_BASE, UART_CLOCK_HZ, 20 UART_BAUDRATE, &s32g2_console); 21 if (ret == 0) { 22 panic();

________________________________________________________________________________________________________ To view the defects in Coverity Scan visit, https://u15810271.ct.sendgrid.net/ls/click?upn=u001.AxU2LYlgjL6eX23u9ErQy-2B...