Hi,

Please find the latest report on new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan.

1 new defect(s) introduced to ARM-software/arm-trusted-firmware found with Coverity Scan.

New defect(s) Reported-by: Coverity Scan Showing 1 of 1 defect(s)

** CID 445539: High impact quality (WRITE_CONST_FIELD) /drivers/arm/dcc/dcc_console.c: 153 in console_dcc_register()

________________________________________________________________________________________________________ *** CID 445539: High impact quality (WRITE_CONST_FIELD) /drivers/arm/dcc/dcc_console.c: 153 in console_dcc_register() 147 .flush = dcc_console_flush, 148 }, 149 }; 150 151 int console_dcc_register(console_t *console) 152 {

...

...

CID 445539:  High impact quality  (WRITE_CONST_FIELD)
A write to an aggregate overwrites a const-qualified field within the aggregate.

153 memcpy(console, &dcc_console.console, sizeof(console_t)); 154 return console_register(console); 155 } 156 157 void console_dcc_unregister(console_t *console) 158 { 159 dcc_console_flush(console); 160 (void)console_unregister(console);

________________________________________________________________________________________________________ To view the defects in Coverity Scan visit, https://u15810271.ct.sendgrid.net/ls/click?upn=u001.AxU2LYlgjL6eX23u9ErQy-2B...